The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Aug. 25, 2022
Applicant:

Icemos Technology Limited, Belfast, GB;

Inventors:

Samuel J. Anderson, Tempe, AZ (US);

Takeshi Ishiguro, Fukushima, JP;

Cathal Duffy, Belfast, GB;

Aymeric Privat, Tempe, AZ (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/18 (2006.01); H01L 21/265 (2006.01); H01L 21/3065 (2006.01); H02M 3/335 (2006.01); H10D 12/01 (2025.01); H10D 30/66 (2025.01); H10D 62/10 (2025.01); H10D 62/822 (2025.01); H10D 62/832 (2025.01);
U.S. Cl.
CPC ...
H01L 21/187 (2013.01); H01L 21/26513 (2013.01); H01L 21/26586 (2013.01); H01L 21/3065 (2013.01); H10D 12/031 (2025.01); H10D 30/668 (2025.01); H10D 62/111 (2025.01); H10D 62/822 (2025.01); H10D 62/8325 (2025.01); H02M 3/33523 (2013.01);
Abstract

A semiconductor device has a substrate made of a first semiconductor material. The first semiconductor material is silicon carbide. A first semiconductor layer made of the first semiconductor material is disposed over the substrate. A second semiconductor layer made of a second semiconductor material dissimilar from the first semiconductor material is disposed over the first semiconductor layer. The first semiconductor material is substantially defect-free silicon carbide, and the second semiconductor material is silicon. A semiconductor device is formed in the second semiconductor layer. The semiconductor device can be a power MOSFET, diode, insulated gate bipolar transistor, cluster trench insulated gate bipolar transistor, and thyristor. The second semiconductor layer with the electrical component provides a first portion of a breakdown voltage for the semiconductor device and the first semiconductor layer and substrate provide a second portion of the breakdown voltage for the semiconductor device.


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