The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Feb. 15, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Nagendra Prasad Ganesh Rao, Folsom, CA (US);

Sead Zildzic, Jr., Rancho Cordova, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/10 (2006.01); G11C 16/08 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 16/102 (2013.01); G11C 16/08 (2013.01); G11C 16/3459 (2013.01);
Abstract

A first program pass of a multi-pass program operation is caused to be performed at a memory array. A first program voltage is applied to a wordline of a block of the memory array to program one or more memory cells during the first program pass. Subsequent to the first program pass of the multi-pass program operation, a pre-read operation is caused to be performed to read data corresponding to the first program pass and from the one or more memory cells. Whether a shift of a threshold voltage corresponding to the one or more memory cells satisfies a condition related to a threshold voltage change is determined based on the pre-read operation. Responsive to determining that the shift of the threshold voltage satisfies the condition, an updated second program voltage of a second program pass of the multi-pass program operation is determined.


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