The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Mar. 25, 2024
Applicant:

Yangtze Memory Technologies Co., Ltd., Wuhan, CN;

Inventors:

Feng Ru, Wuhan, CN;

Xiang Xu, Wuhan, CN;

Yangyang Zhang, Wuhan, CN;

Mengda Wang, Wuhan, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31722 (2013.01); G01R 31/31707 (2013.01); G01R 31/31718 (2013.01);
Abstract

In certain aspects, a pattern generation system includes a memory and a processor coupled to the memory. The memory is configured to store a lookup table set. The lookup table set includes a mapping relationship between source patterns and a set of test channels, and is indexed based on a pin function index. The processor is configured to generate the source patterns, execute a pin-mapping operation based on an instruction to obtain a set of source selection signals for the set of test channels based on the pin function index and the lookup table set, and select and output a source signal from the source patterns for each test channel based on a corresponding source selection signal for the respective test channel.


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Ru, Feng. (2025). Pattern generation system with pin function mapping (U.S. Patent No. 12504470). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12504470

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