The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Mar. 05, 2024
Ishida Co., Ltd., Kyoto, JP;
Keisuke Yoshida, Ritto, JP;
Futoshi Yurugi, Ritto, JP;
Osamu Hirose, Ritto, JP;
Kazuyuki Sugimoto, Ritto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes a conveying unit configured to convey an article, an X-ray source configured to irradiate the article with X-rays, a detection unit configured to detect the X-rays by photon counting, a threshold value setting unit configured to set a threshold value for discriminating the X-rays, an inspection unit configured to inspect the article on the basis of the X-rays transmitted through the article, the X-rays being detected by the detection unit, and a sensitivity correction unit configured to perform sensitivity correction of the detection unit on the basis of the X-rays not transmitted through the article, the detection unit is configured to discriminate and detect the X-rays into the two or more energy regions by using the threshold value, and the sensitivity correction unit is configured to perform the sensitivity correction when the threshold value setting unit changes the threshold value.