The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Feb. 19, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Sridhar Prudviraj Gunda, Karnataka, IN;

Thibash Rajamani Balakrishnan, Karnataka, IN;

Saurav Pundir, Karnataka, IN;

Sunil Singh Dhanik, Karnataka, IN;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0754 (2013.01); G11C 29/44 (2013.01);
Abstract

Methods, systems, and devices for efficient performance of error rate detection procedures in a memory system are described. A memory system may determine whether a condition for performing an error rate detection procedure has been satisfied. Based on determining that the condition has been satisfied, the memory system may add a request for the error rate detection procedure to a queue. The memory system may then perform the error rate detection procedure indicated by the request in the queue based on determining that access activity from a host system has lapsed for a threshold duration.


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