The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jan. 10, 2022
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Manuel Amthor, Jena, DE;
Daniel Haase, Zoellnitz, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06T 5/60 (2024.01); G06T 7/00 (2017.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G06T 5/60 (2024.01); G06T 7/0014 (2013.01); G06V 10/764 (2022.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30242 (2013.01);
Abstract
In a method for evaluating image processing results, at least two microscope images that show the same structure are received. Each of the microscope images is processed by means of an image processing algorithm for calculating a respective image processing result. At least one confidence score of the image processing results is determined based on a degree of correspondence between the image processing results calculated from different microscope images.