The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
May. 29, 2023
Via Labs, Inc., New Taipei, TW;
VIA LABS, INC., New Taipei, TW;
Abstract
An integrated circuit (IC), a testing system, and an operating method are provided. The IC includes a receiver circuit and a processing circuit. The receiver circuit processes a communication signal based on a setting threshold voltage and multiple current operating parameters. The processing circuit obtains at least one current parameter among the current operating parameters. When a host inquires the IC about a receiver margin for the communication signal, the processing circuit obtains eye height data corresponding to the current parameter from a parameter-to-eye height mapping relationship, and returns the receiver margin corresponding to the eye height data to the host. A testing device of the testing system calculates the eye height data based on a setting testing threshold voltage and a target parameter corresponding to a test signal, and generates the parameter-to-eye height mapping relationship based on the target parameter and the eye height data.