The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Apr. 09, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Wenjun Wu, Shanghai, CN;

Feng Xu, Shanghai, CN;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G06F 13/1689 (2013.01);
Abstract

Methods, systems, and devices for dynamically adjusting data read size are described. A memory system controller may be configured to dynamically adjust a size of data transmitted to a host system based on determining a quantity of data requested by the host system. The memory system controller may support receiving a read command of a first data size, incrementing a counter by the first data size, requesting the data from a memory device according to a second data size, and transmitting the data from the memory device according to a third data size based on the counter. The memory system controller may determine the counter does not satisfy a threshold and configure the third data size as a relatively small quantity of data. However, the memory system controller may determine the counter satisfies the threshold and configure the third data size as a relatively large quantity of data.


Find Patent Forward Citations

Wu, Wenjun. (2025). Dynamically adjusting data read size (U.S. Patent No. 12487949). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12487949

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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