The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Jul. 29, 2020
Applicant:

Peridot Print Llc, Palo Alto, CA (US);

Inventors:

Lei Chen, Palo Alto, CA (US);

Maria Fabiola Leyva Mendivil, Guadalajara, MX;

Jun Zeng, Palo Alto, CA (US);

Assignee:

Peridot Print LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4099 (2006.01); B22F 10/85 (2021.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); B22F 10/85 (2021.01); B33Y 50/00 (2014.12); G05B 2219/49023 (2013.01);
Abstract

Examples of methods for thermal image determination are described. In some examples, a method may include determining, using a first machine learning model, a first thermal image of a first layer of additive manufacturing. In some examples, the method may include determining, using a second machine learning model, a second thermal image of a second layer based on a simulated thermal image. The second thermal image may have a second resolution that is greater than a first resolution of the simulated thermal image in some examples. In some examples, the method may include determining, using a third machine learning model, a third thermal image based on the first thermal image and the second thermal image.


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