The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

May. 06, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Harry-Hak-Lay Chuang, Zhubei, TW;

Wei Cheng Wu, Zhubei, TW;

Chung-Jen Huang, Tainan, TW;

Wen-Tuo Huang, Tainan, TW;

Ya-Chi Hung, Kaohsiung, TW;

Chia-Sheng Lin, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/762 (2006.01); H01L 23/00 (2006.01); H01L 23/48 (2006.01); H01L 23/522 (2006.01); H01L 23/544 (2006.01); H01L 23/58 (2006.01); H01L 25/065 (2023.01); H10D 84/01 (2025.01); H10D 84/03 (2025.01);
U.S. Cl.
CPC ...
H01L 21/76229 (2013.01); H01L 21/76232 (2013.01); H01L 23/481 (2013.01); H01L 23/5226 (2013.01); H10D 84/0151 (2025.01); H10D 84/038 (2025.01);
Abstract

Various embodiments of the present disclosure are directed towards an integrated chip (IC). The IC includes a first deep trench isolation (DTI) structure in a substrate. A dielectric structure is over the substrate. An interconnect structure is in the dielectric structure. The interconnect structure includes a lower interconnect structure and an upper interconnect structure that are electrically coupled together. The upper interconnect structure includes a plurality of conductive plates. The plurality of conductive plates are vertically stacked and electrically coupled together. A back-side through substrate via (BTSV) is in the substrate and the dielectric structure. The BTSV extends from a conductive feature of the lower interconnect structure through the dielectric structure and the substrate. The conductive feature of the lower interconnect structure is at least partially laterally within a perimeter of the DTI structure. The BTSV is within the perimeter of the DTI structure.


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