The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jun. 09, 2023
Anritsu Corporation, Kanagawa, JP;
Ryota Takasu, Kanagawa, JP;
Taichi Murakami, Kanagawa, JP;
ANRITSU CORPORATION, Kanagawa, JP;
Abstract
An object of the present disclosure is to provide a loss analysis device and a loss analysis method of detecting an event with high reproducibility when an SN ratio is small or when an event interval is short. According to the present disclosure, a loss analysis device includes an OTDR waveform acquisition unit that acquires an OTDR waveform of a measurement target optical fiber, and a calculation unit that performs nonlinear fitting of an event model function to the OTDR waveform and calculates a position of a start point of each event included in the OTDR waveform, a level at the start point of each event, a loss of each event, and a return loss of each event, the event model function using the position, the level, the loss, and the return loss as parameters.