The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jul. 24, 2023
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Peng Zhang, San Jose, CA (US);

Yanli Zhang, San Jose, CA (US);

Dengtao Zhao, Los Gatos, CA (US);

Jiacen Guo, Sunnyvale, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/08 (2006.01); G11C 16/04 (2006.01); G11C 16/10 (2006.01); G11C 16/34 (2006.01); H01L 25/065 (2023.01);
U.S. Cl.
CPC ...
G11C 16/08 (2013.01); G11C 16/0483 (2013.01); G11C 16/10 (2013.01); G11C 16/3459 (2013.01); H01L 25/0657 (2013.01); H01L 2225/06562 (2013.01);
Abstract

Memory cells of a second sub-block are programmed by pre-charging channels of unselected memory cells connected to the selected word line, boosting the pre-charged channels of unselected memory cells and applying a program voltage to selected non-volatile memory cells connected to the selected word line. The pre-charging includes applying one or more overdrive voltages to word lines connected to memory cells of a first sub-block to provide a conductive path from memory cells of the second sub-block through the first sub-block to a source line and maintaining the word lines connected to memory cells of the first sub-block at one or more overdrive voltages while ramping down signals at the end of the pre-charging. Dummy word lines, positioned between sub-blocks, are maintained at a resting voltage during the boosting in order to cut-off channels of memory cells in the second sub-block from channels of memory cells in the first sub-block.


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