The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Oct. 11, 2022
Anritsu Corporation, Kanagawa, JP;
Osamu Takata, Kanagawa, JP;
Shinya Waki, Kanagawa, JP;
ANRITSU CORPORATION, Kanagawa, JP;
Abstract
An article inspection apparatus inspects a workpiece W including a plurality of ingredients Wa, Wb, Wc, and Wd by using an inspection image of the workpiece. The article inspection apparatus includes an X-ray image memorythat stores information of a predetermined detection value related to the inspection image, a configuration determination unitthat determines a material configuration of a content in the workpiece W by performing predetermined recognition processing based on image data of the workpiece W obtained by capturing of the camera, and a proposal output unitthat, when the configuration determination unitdetermines the material configuration of the content, estimates detection sensitivity to the predetermined detection value based on information stored in the X-ray image memoryand a management sensitivity memory, and proposes and outputs a determination criterion for an article inspection.