The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Oct. 23, 2020
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Matthew Andrew, Livermore, CA (US);
William Thompson, Torrance, CA (US);
Joaquin Correa, Oakland, CA (US);
Edward Hill, Cambridgeshire, GB;
Benjamin Tordoff, Ulm, DE;
Richard Moralee, Cambridgeshire, GB;
Assignee:
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/4046 (2024.01); G01V 8/10 (2006.01); G06F 18/214 (2023.01); G06F 18/23 (2023.01); G06V 10/82 (2022.01); G06V 20/69 (2022.01); G06V 30/24 (2022.01);
U.S. Cl.
CPC ...
G06T 3/4046 (2013.01); G01V 8/10 (2013.01); G06F 18/214 (2023.01); G06F 18/23 (2023.01); G06V 10/82 (2022.01); G06V 20/698 (2022.01); G06V 30/2504 (2022.01);
Abstract
A method of enhancing a resolution of an EDS image of a sample includes generating an EDS image of the sample, generating a non-EDS image of the sample generating, using a machine learning algorithm, an enhanced resolution EDS image of the sample based on the generated feature map and based on the first EDS image, where a resolution of the enhanced resolution EDS image is higher than a resolution of the first EDS image.