The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Oct. 17, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Dmitri Yudanov, Rancho Cordova, CA (US);

Samuel E. Bradshaw, Sacramento, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 9/4401 (2018.01); G06F 9/445 (2018.01); G06F 12/06 (2006.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06F 9/4406 (2013.01); G06F 9/44505 (2013.01); G06F 12/0638 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06F 2212/205 (2013.01);
Abstract

In a mobile device, processes of an application can be monitored and scored for initial data distribution. Specifically, a method can include monitoring processes of an application, and scoring objects or components used by the processes to determine placement of the objects or components in memory during initiation of the application. The method can also include, during initiation of the application, loading, into a first portion of the memory, at least partially, the objects or components scored at a first level. The method can also include, during initiation of the application, loading, into a second portion of the memory, at least partially, the objects or components scored at a second level. The objects or components scored at the second level can be less critical to the application than the objects or components scored at the first level.


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