The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Nov. 01, 2022
Applicant:

Jeol Ltd., Tokyo, JP;

Inventors:

Kouta Itoh, Tokyo, JP;

Atsuhiro Fujii, Tokyo, JP;

Yuka Otake, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/2208 (2018.01); G01N 23/2252 (2018.01); G06T 7/00 (2017.01); G16C 20/80 (2019.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2208 (2013.01); G01N 23/2252 (2013.01); G06T 7/0004 (2013.01); G16C 20/80 (2019.02); G01N 2223/402 (2013.01); G01N 2223/423 (2013.01); G01N 2223/605 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); H01J 37/26 (2013.01);
Abstract

A phase analyzer includes a data acquisition unit that acquires spectrum imaging data in which a position on a sample is associated with a spectrum of a signal from the sample; a candidate determination unit that performs multivariate analysis on the spectrum imaging data to determine candidates for the number of phases; a phase analysis unit that creates, for each of the candidates, a phase map group including a number of phase maps corresponding to the number of phases; and a display control unit that causes a display unit to display, for each of the candidates, the phase map group.


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