The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

May. 02, 2024
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Yuto Shibuta, Fukuoka, JP;

Shohei Higashi, Fukuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 1/08 (2006.01); H03K 17/082 (2006.01); H03K 17/18 (2006.01); H03K 17/08 (2006.01);
U.S. Cl.
CPC ...
H02M 1/08 (2013.01); H03K 17/0826 (2013.01); H03K 17/18 (2013.01); H03K 2017/0806 (2013.01);
Abstract

An object is to provide a technique which enables an outer portion to identify a type of an error state from an identification signal in an early state. A semiconductor element drive device includes a plurality of error state detection circuits generating an error signal corresponding to an error state, an error state identification signal generation circuit generating an error state identification signal having a different waveform for each type of the error state and having a pulse width smaller than each error signal based on the plurality of error signals generated in the plurality of error state detection circuits, respectively, and an error state identification signal output terminal outputting an error state identification signal.


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