The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Jan. 10, 2025
Applicant:

Palantir Technologies Inc., Denver, CO (US);

Inventors:

Benjamin Duffield, New York, NY (US);

David Tobin, Atherton, CA (US);

Hasan Dincel, London, GB;

Mihir Pandya, Palo Alto, CA (US);

Stephen Nicholas Barton, New York, NY (US);

Samantha Woodward, New York, NY (US);

Assignee:

Palantir Technologies Inc., Denver, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/2455 (2019.01); G06F 16/2457 (2019.01); G06F 16/248 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2264 (2019.01); G06F 16/2455 (2019.01); G06F 16/24573 (2019.01); G06F 16/248 (2019.01); G06F 16/283 (2019.01);
Abstract

A method may comprise receiving a query for performing one or more computational operations on one or more multi-dimensional data sets representing multi-dimensional time series data collected in real-time from one or more sensors associated with one or more technical systems. The method may also comprise identifying the location of the one or more multi-dimensional time series data sets in one or more databases, retrieving the one or more multi-dimensional time series data sets from the identified one or more databases, and performing the one or more computational operations on the retrieved one or more multi-dimensional time series data sets. The method may also comprise generating output based on the result of the one or more computational operations indicative of one or more states of the one or more technical systems with respect to time.


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