The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Apr. 02, 2024
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Kazuki Isozumi, Kuwana, JP;

Shinsuke Yada, Nagoya, JP;

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0604 (2013.01); G06F 3/0679 (2013.01);
Abstract

To address neighbor select gate interference between neighboring NAND block sub-divisions when one sub-division is program selected and its neighbor is un-selected, a biasing scheme for the GIDL select gates is introduced to reduce such disturbs. In a three-dimensional NAND memory with a sub-division structure and with two drain side GIDL select gate layers, when a sub-division is program selected and its neighboring sub-division is un-selected, the upper of the two drain side GIDL select gate layers is biased to a first voltage for all of the sub-divisions, while for the lower drain side GIDL select gate layer the gates are biased to be off for the un-selected sub-divisions and biased at a second voltage for the selected sub-division, where the second voltage is configured to turn on the lower drain side GIDL select gates and the first voltage is of a higher level than the second voltage.


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