The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Dec. 21, 2021
Applicant:

Abberior Instruments Gmbh, Gottingen, DE;

Inventors:

Benjamin Harke, Gottingen, DE;

Lars Kastrup, Gottingen, DE;

Christian Wurm, Gottingen, DE;

Assignee:

ABBERIOR INSTRUMENTS GMBH, Gottingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2024.01); G01N 15/1429 (2024.01); G01N 15/1434 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1425 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G01N 15/1456 (2013.01);
Abstract

The invention is directed to a method for recording a motion trajectory of an individual particle in a sample and to a light microscope performing this method. Starting from an at least approximately known initial position, the particle is scanned with an intensity distribution of a scanning light comprising a local intensity minimum. When illuminated with the scanning light, the particle to be tracked generates a detectable light signal, from the intensity of which updated coordinates of the particle are calculated. According to the invention, the scanning is terminated when a second measured variable detected in parallel satisfies a termination criterion.


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