The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Mar. 19, 2020
Ebara Corporation, Tokyo, JP;
Hiroyuki Shinozaki, Tokyo, JP;
EBARA CORPORATION, Tokyo, JP;
Abstract
The present application provides a technique for testing execution data and an operation of an AM apparatus by bringing the AM apparatus into operation before actually carrying out fabrication. An AM apparatus configured to manufacture a fabricated object is provided. This AM apparatus includes a chamber defining a space used to manufacture the fabricated object, a base plate disposed in the chamber and configured to support a material of the fabricated object, a beam source configured to irradiate the material on the base plate with a beam, a computer configured to determine an irradiation position of the beam based on three-dimensional data of the fabricated object, a scanning mechanism configured to move the beam according to the determined irradiation position, a detector configured to detect an irradiation position of the beam applied into the chamber, and an evaluator configured to compare the determined irradiation position and the detected irradiation position.