The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Dec. 05, 2022
Tohoku University, Miyagi, JP;
Konica Minolta, Inc., Tokyo, JP;
Hidechika Ito, Sendai, JP;
Shingo Kagami, Sendai, JP;
Koichi Hashimoto, Sendai, JP;
Daichi Suzuki, Tachikawa, JP;
Yoshiyuki Toso, Toyokawa, JP;
Yoshihiro Inagaki, Hachioji, JP;
Konica Minolta, Inc., Tokyo, JP;
Tohoku University, Miyagi, JP;
Abstract
A three-dimensional shape measuring method includes: a first step to: project first and second projection images on a target object, wherein the first projection images include row-direction stripe patterns different from each other, and the second projection images include column-direction stripe patterns different from each other, and obtain first and second captured images of the target object, wherein the first captured images are captured while the first projection images are projected, and the second captured images are captured while the second projection images are projected; a second step to identify a corresponding projection pixel of the first and second projection images, wherein the corresponding projection pixel corresponds to each of captured pixels of the first and second captured images; and a third step to identify a 3D shape of the target object based on a result of the second step.