The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Feb. 26, 2024
Intel Corporation, Santa Clara, CA (US);
Karthik Vaidyanathan, San Francisco, CA (US);
Carsten Benthin, Voelklingen, DE;
Sven Woop, Voelklingen, DE;
Intel Corporation, Santa Clara, CA (US);
Abstract
Apparatus and method for box-box testing. For example, one embodiment of a processor comprises: a bounding volume hierarchy (BVH) generator to construct a BVH comprising a plurality of hierarchically arranged BVH nodes; traversal circuitry to traverse query boxes through the BVH, the traversal circuitry to read a BVH node from a top of a BVH node stack and to read a query box from a local storage or memory, the traversal circuitry further comprising: box-box testing circuitry and/or logic to compare maximum and minimum X, Y, and Z coordinates of the BVH node and the query box and to generate an overlap indication if overlap is detected for each of the X, Y, and Z dimensions; distance determination circuitry and/or logic to generate a distance value representing an extent of overlap between the BVH node and the query box; and sorting circuitry and/or logic to sort the BVH node within a set of one or more additional BVH nodes based on the distance value.