The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Nov. 18, 2022
Applicants:

Shimadzu Corporation, Kyoto, JP;

Kwansei Gakuin Educational Foundation, Nishinomiya, JP;

Inventors:

Ikuko Yao, Sanda, JP;

Yuzuki Morita, Nagoya, JP;

Shinichi Yamaguchi, Kyoto, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16B 40/10 (2019.01); G16B 40/30 (2019.01); H01J 49/00 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
G16B 40/10 (2019.02); G16B 40/30 (2019.02); H01J 49/0004 (2013.01); H01J 49/0036 (2013.01); H01J 49/164 (2013.01);
Abstract

In a data-analyzing method in which an analysis based on a plurality of data groups each obtained by an instrumental analysis on each of a plurality of samples, with each data group including signal values having an n-dimensional array structure (where n≥2), is performed by using a computer, to obtain desired information concerning a difference between the samples, the method includes: a computational processing step for performing, in each data group, a persistent-homology processing on data including signal values having an m-dimensional array structure (where 2≤m≤n) obtained from one data group, to create a persistence diagram (PD); and an analytical processing step for comparing PDs respectively obtained from the data groups, to obtain the desired information based on a difference in the dispersion state of plots across the entire PDs being compared and/or based on information concerning a plot having no positional correspondence determined on the PDs being compared.


Find Patent Forward Citations

Loading…