The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Sep. 26, 2022
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Yi-Min Jiang, Campbell, CA (US);

Xiang Gao, San Jose, CA (US);

Lixin Shao, Sunnyvale, CA (US);

Pedja Raspopovic, Cary, NC (US);

Assignee:

Synopsys, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/31 (2020.01); G06F 30/392 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/31 (2020.01); G06F 30/392 (2020.01);
Abstract

In one aspect, QoR metrics for different candidate macro placements are estimated using machine learning models. A set of candidate macro placements of hard macros within a circuit design is assessed by estimating a quality metric for each candidate macro placement, as follows. Model-specific estimates of the quality metric are predicted by applying different machine learning models to the candidate macro placements. The different machine learning models are trained using sets of completed macro placements for other circuit designs. The model-specific estimates of the quality metric are combined based on an applicability of (a) the set of macro placements used to train that model to (b) the set of candidate macro placements being evaluated.


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