The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Aug. 24, 2022
Applicant:
Tektronix, Inc., Beaverton, OR (US);
Inventor:
Kan Tan, Portland, OR (US);
Assignee:
Tektronix, Inc., Beaverton, OR (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01); G01R 23/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/029 (2013.01); G01R 13/0218 (2013.01); G01R 23/02 (2013.01);
Abstract
A test and measurement device has an input port to receive a signal from a device under test (DUT), the signal having a symbol rate, one or more analog-to-digital converters (ADC) to convert the signal to waveform samples at a sampling rate, and one or more processors, when aliasing is present: up-sample a portion of the signal having aliased samples to produce up-sampled samples; use the up-sampled samples to produce a real-time waveform; perform clock recovery on the real-time waveform to produce a recovered clock; and resample the aliased samples to produce a non-aliased waveform.