The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Feb. 03, 2023
Onto Innovation Inc., Wilmington, MA (US);
Michael B. North Morris, Tucson, AZ (US);
Onto Innovation Inc., Wilmington, MA (US);
Abstract
A Mach-Zehnder interferometer is configured for measuring a transparent test object, such as measuring the power of a lens. The test object, for example, may be an interocular lens. The interferometer splits an illumination beam into a reference beam and test beam. The test beam is transmitted through the test object and one or more auxiliary lenses. The configuration and respective positions of the test object and one or more auxiliary lenses are configured to collimate the test beam. The one or more auxiliary lenses and/or test object may be positioned at different relative distances. The reference beam and test beam are recombined and the interference patterns imaged for different relative distances between the test object and one or more auxiliary lenses. A lens power may be determined based on the interferometric power measurements from the images and the change in the relative distances used for the images.