The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Aug. 18, 2021
Applicant:

Siltronic Ag, Munich, DE;

Inventors:

Lucas Becker, Simbach, DE;

Peter Storck, Burghausen, DE;

Assignee:

SILTRONIC AG, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); C23C 16/02 (2006.01); C23C 16/04 (2006.01); C23C 16/06 (2006.01); C30B 25/04 (2006.01); C30B 25/18 (2006.01); C30B 29/52 (2006.01); H01L 21/02 (2006.01); H01L 21/36 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02532 (2013.01); C23C 16/029 (2013.01); C23C 16/042 (2013.01); C23C 16/06 (2013.01); C30B 25/04 (2013.01); C30B 25/18 (2013.01); C30B 29/52 (2013.01); H01L 21/02381 (2013.01); H01L 21/02639 (2013.01);
Abstract

A method heteroepitaxially deposits a silicon germanium layer on a substrate. The silicon germanium layer has a composition SiGe, where 0.01≤x≤1. The substrate is a silicon single crystal wafer or a silicon-on-insulator wafer. The method includes: providing a mask layer atop the substrate; removing the mask layer in an edge region of the substrate to provide access to an annular-shaped free surface of the substrate in the edge region of the substrate surrounding a remainder of the mask layer; depositing an edge reservoir consisting of a relaxed or partially relaxed silicon germanium layer atop the annular-shaped free surface of the substrate; removing the remainder of the mask layer; and depositing the silicon germanium layer atop the substrate and atop the edge reservoir, the silicon germanium layer contacting an inner lateral surface of the edge reservoir.


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