The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Oct. 05, 2021
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Manuel Amthor, Jena, DE;
Daniel Haase, Zöllnitz, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G02B 21/36 (2006.01); G06F 18/20 (2023.01); G06F 18/2431 (2023.01); G06N 20/00 (2019.01); G06T 7/11 (2017.01); G06V 10/44 (2022.01); G06V 10/75 (2022.01); G06V 10/94 (2022.01);
U.S. Cl.
CPC ...
G06F 18/214 (2023.01); G02B 21/365 (2013.01); G06F 18/2431 (2023.01); G06F 18/285 (2023.01); G06N 20/00 (2019.01); G06T 7/11 (2017.01); G06V 10/44 (2022.01); G06V 10/7515 (2022.01); G06V 10/95 (2022.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
A microscopy system for generating training data for a machine learning model comprises a microscope configured to capture an image. The microscopy system further comprises a computing device configured to generate a segmentation mask based on the image, adjust a pattern described by a parameterized model to the segmentation mask, generate an updated segmentation mask using the adjusted pattern, and incorporate the updated segmentation mask or an image derived from the same in the training data.