The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Mar. 11, 2024
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventor:

Jörg Steinert, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G02B 26/10 (2006.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
G02B 26/101 (2013.01); G02B 26/105 (2013.01); G01S 7/4817 (2013.01);
Abstract

A scanning device for scanning a scan field, and a method for operating the device, said scanning device having a first scanner and a second scanner, each with a frame that is movable about a first oscillation axis and, held in said frame a scanning mirror that can be excited resonantly to vibrate about a second oscillation axis. The scanners are arranged in a beam path and imaged onto one another. Their spatial and temporal alignments are matched to one another by means of a controller and by means of drives of the scanners connected therewith, for the purpose of scanning the scan field. Each scanner is a 2-axis scanner whose respective first oscillation axis is directed orthogonally to the respective second oscillation axis.


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