The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Jul. 19, 2023
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Sarath Puthenthermadam, San Jose, CA (US);

Yihang Liu, Santa Clara, CA (US);

Jiahui Yuan, Fremont, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0629 (2013.01); G06F 3/0619 (2013.01); G06F 3/0679 (2013.01); G11C 29/12005 (2013.01); G11C 2029/1202 (2013.01);
Abstract

An apparatus is provided that includes a control circuit coupled to a plurality of non-volatile memory cells. The control circuit is configured to perform a program-verify iteration on a first set of the non-volatile memory cells and a second set of the non-volatile memory cells in a plurality of program loops, determine that at least one of the first set of the non-volatile memory cells and the second set of the non-volatile memory cells verification to a programmed state in a first number of program loops, and compare a difference between the first number of program loops and the second number of program loops to an adaptive maximum loop delta limit. The adaptive maximum loop delta limit varies as a function of temperature.


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