The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

May. 15, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Ryo Nakayama, Tochigi, JP;

Takahiro Matsumoto, Tochigi, JP;

Takafumi Miyaharu, Tochigi, JP;

Hironobu Fujishima, Saitama, JP;

Yuichi Fujita, Tochigi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/04 (2006.01); G01B 11/25 (2006.01); G03G 15/043 (2006.01); G03G 15/16 (2006.01);
U.S. Cl.
CPC ...
G03G 15/04036 (2013.01); G01B 11/254 (2013.01); G03G 15/04018 (2013.01); G03G 15/0435 (2013.01); G03G 15/1605 (2013.01);
Abstract

A detection apparatus includes an image sensing device having an image sensing plane including a first periodic structure; and an optical system configured to illuminate a detection target including a second periodic structure different from the first periodic structure, and form an image of light from the detection target on the image sensing plane. Light having entered the image sensing plane generates a plurality of diffracted light beams of different orders in accordance with the first periodic structure. A normal of the image sensing plane is tilted with respect to an optical axis of the optical system such that the optical axis is located between diffracted light beams of adjacent orders not less than a first order among the plurality of diffracted light beams.


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