The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Jul. 03, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Tomohito Nakano, Tokyo, JP;

Makoto Suzuki, Tokyo, JP;

Yuzuru Mizuhara, Tokyo, JP;

Ryota Watanabe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/141 (2006.01); H01J 37/153 (2006.01); H01J 37/21 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/141 (2013.01); H01J 37/153 (2013.01); H01J 37/21 (2013.01); H01J 37/28 (2013.01); H01J 2237/216 (2013.01);
Abstract

This charged particle beam device comprises: a charged particle beam source that generates charged particle beams; an objective lens in which coil current is inputted to focus the charged particle beams on a sample; a control unit that controls the coil current; a hysteresis characteristics storage unit that stores hysteresis characteristics information of the objective lens; a history information storage unit that stores history information relating to the coil current; and an estimating unit that estimates the magnetic field generated by the objective lens based on the coil current, the history information, and the hysteresis characteristic information, and has a magnetic field correction unit that, when the absolute value of the change amount of the coil current is greater than a prescribed value, further adds to the magnetic field estimated by the estimating unit a correction value according to the coil current and its change amount, correcting the magnetic field generated by the objective lens.


Find Patent Forward Citations

Nakano, Tomohito. (2025). Charged particle beam device, and method for adjusting image capturing conditions in said charged particle beam device (U.S. Patent No. 12424406). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12424406

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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