The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Jul. 18, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Win-San Khwa, Taipei, TW;

Jen-Chieh Liu, Hsinchu, TW;

Meng-Fan Chang, Taichung, TW;

Tung-Ying Lee, Hsinchu, TW;

Jin Cai, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01); G11C 29/44 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 16/102 (2013.01); G11C 16/26 (2013.01); G11C 29/4401 (2013.01); G11C 2029/1208 (2013.01);
Abstract

A control circuit, a memory system and a control method are provided. The control circuit is configured to control a plurality of memory cells of a memory array. The control circuit comprises a program controller. The program is configured to program a first electrical characteristic distribution and a second electrical characteristic distribution of the memory cells according to error tolerance of a first bit of a data type. A first overlapping area between the first electrical characteristic distribution and the second electrical characteristic distribution is smaller than a first predetermined value.


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