The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
May. 09, 2023
Semitec Corporation, Tokyo, JP;
Katsuhisa Taguchi, Tokyo, JP;
Toshiyuki Nojiri, Tokyo, JP;
SEMITEC Corporation, Tokyo, JP;
Abstract
Provided is a deep temperature measuring device and a deep temperature measuring method capable of measuring a deep temperature of a measured object with high precision, high accuracy, and high-speed responsiveness. The above-described problem is solved by a deep temperature measuring device comprising a thermosensitive part (Ts) that senses temperature, a measurement thin film thermistor capable of measuring temperature by the thermosensitive part (Ts) being brought into contact with a measured object, a heating element layer that heats the measurement thin film thermistor, a control thin film thermistor disposed sandwiching a first heat-insulating layer with the measurement thin film thermistor and the control thin film thermistor and configured to control a temperature of the heating element layer so that the temperature is equal to a temperature of the measurement thin film thermistor, and a second heat-insulating layer that covers the heating element layer.