The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Mar. 29, 2022
Applicant:
Fei Company, Hillsboro, OR (US);
Inventors:
Darius Kocár, Portland, OR (US);
Michael James Owen, Brisbane, AU;
Assignee:
FEI Company, Hillsboro, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G01N 23/203 (2006.01); G01N 23/2206 (2018.01); G01N 23/223 (2006.01); G06V 10/143 (2022.01); G06V 10/26 (2022.01);
U.S. Cl.
CPC ...
G06V 20/693 (2022.01); G01N 23/203 (2013.01); G01N 23/2206 (2013.01); G01N 23/223 (2013.01); G06V 10/143 (2022.01); G06V 10/267 (2022.01); G06V 20/695 (2022.01); G06V 20/698 (2022.01);
Abstract
The invention relates to method and system configured for material analysis and mineralogy. At least one image based on first emission from a sample is provided. First spectra of the sample based on second emissions from the second scan locations of the image are provided. A confidence score is calculated for every first spectrum, and second scan location(s) with confidence score(s) below a threshold value are selected. Second emissions from the selected second scan location(s) are acquired to provide new image and determine new second scan locations within the respective new image.