The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Nov. 25, 2021
Beijing Institute of Nanoenergy and Nanosystems, Beijing, CN;
Zhonglin Wang, Beijing, CN;
Shiquan Lin, Beijing, CN;
BEIJING INSTITUTE OF NANOENERGY AND NANOSYSTEMS, Beijing, CN;
Abstract
A method and an apparatus for measuring an electrical property of a sample material are provided. In the method, an alternating voltage is applied to a piezoelectric ceramic so that a probe fixed on the piezoelectric ceramic vibrates above a surface of the sample material, a target contact potential difference between the probe and the sample material is measured, and a target amplitude of an induced alternating current generated due to the vibration of the probe above the surface of the sample material, a target work function of the surface of the sample material is determined according to the target contact potential difference and a determined work function of the probe, and a target charge density of the surface of the sample material is determined according to the target amplitude, the target contact potential difference, and a pre-stored target amplitude determination function for the induced alternating current.