The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Apr. 03, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chien-Fa Lee, Hsinchu, TW;

Hsu-Shui Liu, Pingjhen, TW;

Jiun-Rong Pai, Jhubei, TW;

Shou-Wen Kuo, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); H01L 21/67 (2006.01); H01L 21/677 (2006.01); H01L 21/68 (2006.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67201 (2013.01); H01L 21/67259 (2013.01); H01L 21/67766 (2013.01); H01L 21/67775 (2013.01); H01L 21/681 (2013.01); H01L 21/68707 (2013.01);
Abstract

The present disclosure relates to a method of programming an EFEM. The method includes placing an automatic teaching element within an EFEM chamber at a first time. The automatic teaching element is operated at a second time to measure one or more parameters corresponding to an initial position of an EFEM robot within the EFEM chamber. The automatic teaching element is removed from the EFEM chamber at a third time and then placed within the EFEM chamber at a fourth time. The automatic teaching element is operated at a fifth time to determine positional parameters describing a difference between the initial position and a new position of the EFEM robot. A second plurality of steps are determined based upon the positional parameters. The EFEM robot is configured to move along the second plurality of steps that extend along a path between first and second positions.


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