The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Dec. 09, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Paolo Fantini, Vimercate, IT;

Corrado Villa, Sovico, IT;

Stefan Frederik Schippers, Peschiera del Garda, IT;

Lorenzo Fratin, Buccinasco, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 13/00 (2006.01); G11C 16/08 (2006.01); G11C 16/10 (2006.01); G11C 16/24 (2006.01);
U.S. Cl.
CPC ...
G11C 16/0433 (2013.01); G11C 13/0004 (2013.01); G11C 13/0026 (2013.01); G11C 13/0028 (2013.01); G11C 16/08 (2013.01); G11C 16/102 (2013.01); G11C 16/24 (2013.01); G11C 2013/0088 (2013.01);
Abstract

The present disclosure provides a memory apparatus and a method for accessing a 3D vertical memory array. The 3D vertical memory array comprises word lines organized in planes separated from each other by insulating material, bit lines perpendicular to the word line planes, memory cells coupled between a respective word line and a respective bit line. The apparatus also comprises a controller configured to select multiple word lines, select multiple bit lines, and simultaneously access multiple memory cells, with each memory cell at a crossing of a selected word line and a selected bit line. The method comprises selecting a multiple word lines, selecting multiple bit lines and simultaneously accessing multiple memory cells, with each memory cell at a crossing of a selected word line of the selected multiple word lines and a selected bit line of the selected multiple bit lines. A method of manufacturing a 3D vertical memory array is also described.


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