The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Mar. 23, 2021
Hitachi High-tech Corporation, Tokyo, JP;
National Institutes for Cultural Heritage, Tokyo, JP;
Hiroyuki Takagi, Tokyo, JP;
Taisuke Murata, Nara, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
NATIONAL INSTITUTES FOR CULTURAL HERITAGE, Tokyo, JP;
Abstract
A particle size distribution measurement method includes: an image acquisition step of acquiring a first CT image of a target sample including the granules; a statistical value calculation step of specifying a region of interest by dividing the acquired first CT image into predetermined grids, and calculating a first statistical value including a grid statistical value for each of the grids and an overall statistical value of the entire first CT image regarding a CT value; and a measurement step of measuring a particle size distribution of the granules in the target sample based on the first statistical value and a second statistical value including a grid statistical value and an overall statistical value of a type same as the grid statistical value and the overall statistical value included in the first statistical value in a second CT image of a standard sample including granules having a known particle size.