The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Dec. 23, 2021
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Albert Molina, Novelda, ES;

Kameran Azadet, San Ramon, CA (US);

Martin Clara, Santa Clara, CA (US);

Daniel Gruber, St. Andrae, AT;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1014 (2013.01);
Abstract

A system and method for calibrating a time-interleaved digital-to-analog converter (DAC). A calibration signal generator generates calibration data, and a time-interleaved DAC converts the calibration data to an analog calibration signal. An observation analog-to-digital converter (ADC) samples, and quantizes, the analog calibration signal filtered by an anti-alias filter. A mismatch estimation block estimates a frequency response mismatch between the sub-DACs and generates a sub-DAC mismatch correction factor based on an output of the observation ADC. The calibration signal generator applies the sub-DAC mismatch correction factor to the calibration data. The mismatch estimation block may estimate a DC offset mismatch between the sub-DACs based on the output of the observation ADC and generates a DC offset correction factor, and the calibration signal generator applies the DC offset correction factor to the calibration data.


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