The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Oct. 11, 2022
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Amit Gopal M. Purohit, Bangalore, IN;
Denis Martin, Mountain View, CA (US);
Paras Chhabra, Bengaluru, IN;
Assignee:
SYNOPSYS, INC., Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/333 (2020.01); G06F 11/263 (2006.01); G06F 11/267 (2006.01); G06F 11/27 (2006.01); G06F 30/20 (2020.01); G06F 30/3308 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01); H03K 3/011 (2006.01); H03K 3/03 (2006.01); H03K 5/00 (2006.01); H03K 19/01 (2006.01); G06F 11/07 (2006.01); H01L 25/00 (2006.01);
U.S. Cl.
CPC ...
G06F 30/333 (2020.01); G06F 11/0766 (2013.01); G06F 11/263 (2013.01); G06F 11/267 (2013.01); G06F 11/27 (2013.01); G06F 30/20 (2020.01); G06F 30/3308 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01); H03K 3/011 (2013.01); H03K 3/03 (2013.01); H03K 5/00 (2013.01); H03K 19/01 (2013.01);
Abstract
A first scan pattern may be received to test a first circuit block in an integrated circuit (IC) design and a second scan pattern may be received to test a second circuit block in the IC design. A first length of the first scan pattern may be different from a second length of the second scan pattern. The first scan pattern, the second scan pattern, or both the first scan pattern and the second scan pattern may be modified to make lengths of the first scan pattern and the second scan pattern equal.