The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Jul. 27, 2021
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Tom H. Rafferty, Austin, TX (US);
Ahmed M. Hussein, Austin, TX (US);
Byung-Jin Choi, Austin, TX (US);
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G03F 7/70625 (2013.01); G03F 7/0002 (2013.01); G03F 7/70425 (2013.01); G03F 7/707 (2013.01); G03F 7/70716 (2013.01); G06N 20/00 (2019.01);
Abstract
Some devices, systems, and methods obtain one or more images of a substrate, wherein the substrate includes a feature pattern; determine one or more edges of the feature pattern based on the one or more images; determine an offset of the feature pattern relative to the substrate and an angle of the feature pattern relative to the substrate based on the one or more edges of the feature pattern; and generate a transformation for a drop pattern based on the offset of the feature pattern and on the angle of the feature pattern.