The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Dec. 17, 2021
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Masakazu Yamamoto, Iwate, JP;

Tadashi Enomoto, Iwate, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/20 (2023.01); G01M 99/00 (2011.01); G06F 30/20 (2020.01); G06Q 10/0631 (2023.01); G06Q 10/067 (2023.01); G06Q 10/087 (2023.01); G06Q 50/04 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/20 (2013.01); G01M 99/008 (2013.01); G06F 30/20 (2020.01); G06Q 10/06316 (2013.01); G06Q 10/067 (2013.01); G06Q 10/087 (2013.01); G06Q 50/04 (2013.01);
Abstract

An information processing apparatus executes a simulation of a state of a process which is being performed in a semiconductor manufacturing apparatus, by using a simulation model of the semiconductor manufacturing apparatus. The information processing apparatus includes: a physical sensor data acquisition unit that acquires physical sensor data measured in the semiconductor manufacturing apparatus that is performing the process according to process parameters; a simulation execution unit that executes the simulation by the simulation model according to the process parameters, thereby outputting virtual sensor data; a simulation result determination unit that performs a pre-detection of a part of the semiconductor manufacturing apparatus that needs to be replaced, based on a difference between the physical sensor data and the virtual sensor data; and a part order unit that orders the part of the semiconductor manufacturing apparatus based on a result of the pre-detection.


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