The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Oct. 05, 2021
Applicant:

Aixtron SE, Herzogenrath, DE;

Inventors:

Karsten Rojek, Mönchengladbach, DE;

Dirk Heydhausen, Aachen, DE;

Assignee:

AIXTRON SE, Herzogenrath, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/52 (2006.01); C23C 16/46 (2006.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
C23C 16/52 (2013.01); C23C 16/46 (2013.01); G01J 5/0007 (2013.01);
Abstract

A substrate is coated with a multilayer structure which has layers of a first portion and layers of a second portion that are deposited on the layers of the first portion. During the deposition of at least one layer of the second portion, at least one optical measuring apparatus measures an emissivity value and a reflectance value on the broad side of the substrate, which broad side comprises the layer. Using a previously determined correction value, an actual value of a temperature of the broad side of the substrate is calculated and, using the actual value, a heating apparatus is controlled in order to control the temperature of the substrate to match a target value of the temperature of the broad side of the substrate. The correction value is determined during the deposition of the first portion, which is carried out immediately before the deposition of the second portion.


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