The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Jun. 21, 2022
Tektronix, Inc., Beaverton, OR (US);
Joshua J. O'brien, Aloha, OR (US);
Timothy E. Bieber, Portland, OR (US);
Barton T. Hickman, Portland, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A test and measurement instrument includes a first data channel including a first data converter operating at a first rate, and a second data channel including a second data converter operating at a second rate that is different than the first rate. Rate controls may include a clock generation circuit. The clock generation circuit includes an intermediate frequency generator structured to generate an intermediate frequency clock from a first clock reference signal, a first frequency clock generator structured to generate a first frequency clock directly from the intermediate frequency clock, and a second frequency clock generator structured to generate a second frequency clock directly from the intermediate frequency clock. The first frequency clock may be used to control the rate of the first data channel, and the second frequency clock may be used to control the rate of the second data channel. Methods are also described.