The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Apr. 20, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Takuya Tamano, Boise, ID (US);

Yoshinori Fujiwara, Boise, ID (US);

Daniel S. Miller, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 29/44 (2006.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G11C 29/46 (2013.01); G11C 29/4401 (2013.01);
Abstract

Methods, apparatuses, and systems may implement adjusted circuit tests. A memory device may include a self-test circuit that is configured to selectively suspend collection and/or processing of test results for one or more portions of the self-test.


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