The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Feb. 07, 2022
Applicant:

Ohio State Innovation Foundation, Columbus, OH (US);

Inventors:

Boyuan Li, Columbus, OH (US);

Carol Smidts, Columbus, OH (US);

Xiaoxu Diao, Columbus, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 17/13 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/0721 (2013.01); G06F 17/13 (2013.01);
Abstract

A model () is created of a system () to be monitored (). Operating states of the monitored system, including steady and transient states, are identified. Faults are injected into the model and the model is used to simulate each of the identified operating states (). Results of each simulation are analyzed and used to develop one or more propagation-based fault detection and discrimination strategies () that can be used to identify faults in each of the identified operating states (). The strategies may further be used to select an optimal set of sensors () to assist with fault detection.


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