The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Nov. 10, 2023
Dong Weon Hwang, Seongnam-si, KR;
Logan Jae Hwang, Beverly Hills, CA (US);
Jae Baek Hwang, Seongnam-si, KR;
Hicon Co., Ltd., Seongnam-si, KR;
Dong Weon Hwang, Seongnam-si, KR;
Logan Jae Hwang, Beverly Hills, CA (US);
Jae Baek Hwang, Seongnam-si, KR;
HICON CO., LTD., Seongnam-si, KR;
Other;
Abstract
Proposed is a socket device for testing integrated circuits (ICs) used to test ICs. The socket device includes a contact module () for seating an IC and having a plurality of contacts () for electrical connection of a lead of the IC and a terminal of a printed circuit board (PCB), and a pusher module () having a latch () to be fit-assembled from a top of the contact module () and for pressurizing the IC, wherein the pusher module () includes a lead frame () with the latch rotatably provided thereto, a pressurizing part () () assembled to the lead frame () with two floating hinge axes (C) (C) parallel to each other and elastically supported against the lead frame, first and second cam shafts () () provided in the respective floating hinge axes (C) (C), a handle (), a lever (), and a link ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile