The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Jul. 21, 2022
Applicant:

Changxin Memory Technologies, Inc., Hefei, CN;

Inventor:

Kanyu Cao, Hefei, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/38 (2006.01); G03F 7/004 (2006.01); G03F 7/039 (2006.01); G03F 7/09 (2006.01); G03F 7/11 (2006.01); G03F 7/16 (2006.01); G03F 7/42 (2006.01);
U.S. Cl.
CPC ...
G03F 7/38 (2013.01); G03F 7/0045 (2013.01); G03F 7/039 (2013.01); G03F 7/094 (2013.01); G03F 7/11 (2013.01); G03F 7/167 (2013.01); G03F 7/42 (2013.01);
Abstract

The present disclosure relates to the technical field of semiconductors, and provides a method of processing a photoresist layer, and a photoresist layer. The method of processing a photoresist layer includes: forming a photoresist layer on a target layer, where the photoresist layer includes a first part away from the target layer and a second part close to the target layer; processing the photoresist layer by using a first process, such that a light absorption rate of the first part is less than a light absorption rate of the second part; performing first exposure processing on the photoresist layer to form an exposure image in the second part; and stripping the first part and performing first development processing on the photoresist layer, to pattern the second part into a photoresist pattern.


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